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Detecting Temporal Correlation on HfO 2 Based RRAM on 65nm CMOS Technology

https://doi.org/10.1109/MDTS54894.2022.9826965

Rafiq, Sarah ; Abedin, Minhaz ; Beckmann, Karsten ; Cady, Nathaniel C. ( August 2022 , 2022 IEEE 31st Microelectronics Design & Test Symposium (MDTS))

Hafnium-oxide based bipolar RRAM was investigated for high-level temporal correlation detection, for in-memory computing. The experimental analog data of HfO2 RRAM, both in RESET and SET regimes was evaluated to detect 10 correlated processes from 25 processes on a 5x5 RRAM array. Our method gave 36,000-53,000 times less energy consumption than that of a previous implementation with phase change memory, and a predicted acceleration of 1600-2100 times the execution time than that of 1xPOWER8 CPU (1 thread) for detecting correlation between 25 processes.
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In-memory Computation of Error-Correcting Codes Using a Reconfigurable HfOx ReRAM 1T1R Array

https://doi.org/10.1109/MWSCAS47672.2021.9531717

Abedin, Minhaz ; Liehr, Maximilian ; Beckmann, Karsten ; Hazra, Jubin ; Rafiq, Sarah ; Cady, Nathaniel C. ( August 2021 , 2021 IEEE International Midwest Symposium on Circuits and Systems (MWSCAS))
Investigation of ReRAM Variability on Flow-Based Edge Detection Computing Using HfO 2 -Based ReRAM Arrays

https://doi.org/10.1109/TCSI.2021.3072210

Rafiq, Sarah ; Hazra, Jubin ; Liehr, Maximilian ; Beckmann, Karsten ; Abedin, Minhaz ; Pannu, Jodh S. ; Jha, Sumit K. ; Cady, Nathaniel C. ( July 2021 , IEEE Transactions on Circuits and Systems I: Regular Papers)

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Design and Fabrication of Flow-Based Edge Detection Memristor Crossbar Circuits 1

https://doi.org/10.1109/TCSII.2020.2984155

Pannu, Jodh Singh ; Raj, Sunny ; Fernandes, Steven Lawrence ; Chakraborty, Dwaipayan ; Rafiq, Sarah ; Cady, Nathaniel ; Jha, Sumit Kumar ( May 2020 , IEEE Transactions on Circuits and Systems II: Express Briefs)

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